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Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy

机译:原子分辨双峰中图像质量的幅度依赖性   原子显微镜

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摘要

In bimodal FM-AFM, two flexural modes are excited simultaneously. The totalvertical oscillation deflection range of the tip is the sum of the peak-to-peakamplitudes of both flexural modes (sum amplitude). We show atomically resolvedimages of KBr(100) in ambient conditions in bimodal AFM that display a strongcorrelation between image quality and sum amplitude. When the sum amplitudebecomes larger than about 200 pm, the signal-to-noise ratio (SNR) isdrastically decreased. We propose this is caused by the temporary presence ofone or more water layers in the tip-sample gap. These water layers screen theshort range interaction and must be displaced with each oscillation cycle.Further decreasing the sum amplitude, however, causes a decrease in SNR.Therefore, the highest SNR in ambient conditions is achieved when the sumamplitude is slightly less than the thickness of the primary hydration layer.
机译:在双峰FM-AFM中,两个弯曲模式同时被激发。尖端的总垂直振动偏转范围是两种弯曲模式的峰峰振幅之和(总振幅)。我们在双峰原子力显微镜中显示了在环境条件下KBr(100)的原子分辨图像,该图像显示了图像质量和总振幅之间的强烈相关性。当总和幅度大于约200 pm时,信噪比(SNR)急剧降低。我们认为这是由于尖端样品间隙中暂时存在一个或多个水层引起的。这些水层屏蔽了短程相互作用,必须在每个振荡周期内进行位移。然而,总和幅度的进一步减小会导致SNR的降低,因此,当总和幅度略小于C的厚度时,在环境条件下可获得最高的SNR。初级水合层。

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